Tag: system-on-chip

 
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System on Chip: the Future of System Integration

System on chip:
The future of the integration paradigm

Syste`me sur une puce:
le futur du paradigme de l’inte ́gration

Wael Badawy

The increase in the number of transistors that can be integrated on a single chip allows the integration of more functions. On the other hand, time-to-market pressures require novel techniques for developing integrated circuits. System on chip is a methodology that allows the integration of several third-party cores with an embedded processor. This paper presents a tutorial for the system- on-chip methodology and presents the design tasks that are involved in developing a system on chip.

L’accroissement du nombre de transistors qu’il est possible d’inte ́grer sur une puce permet d’offrir plus de fonctionnalite ́s. D’autre part, les pressions de la mise en marche ́ rapide de celles-ci exige l’e ́laboration de techniques nouvelles de de ́veloppement de circuits inte ́gre ́s. Les syste`mes sur une puce repre ́sentent une me ́thodologie de de ́veloppement qui permet l’inte ́gration de com- posantes provenant de plusieurs de ́veloppeurs et de les combiner a` un processeur embarque ́. Cet article pre ́sente un tutoriel sur la me ́thodologie de conception de circuits sur une puce et pre ́sente les taˆches de design implique ́es dans le de ́veloppement de tels syste`mes.

 

Wael Badawy, “System on Chip: the Future of System Integration,” The Canadian Journal on Electrical and Computer Engineering, Vol. 27, No. 4, October 2002, pp. 149 – 154

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DeFET: A Novel CMOS Electric-Field Sensor for Lab-on-a-Chip and Biomedical Applications

This paper presents a novel CMOS electric-field sensor, it is called the “differential electric-field sensitive field-effect transistor” (DeFET), which is based on a standard 0.18-mum Taiwan Semiconductor Manufacturing Company (TSMC) CMOS technology. The DeFET shows a sensitivity of 51.7 mV/(V/mum). This paper also describes the DeFET’s theory of operation in addition to the experimental and simulation results that confirm the DeFET’s theory of operation. Some applications of the DeFET in the area of lab on a chip and biomedical are also presented

Published in:

Sensors Journal, IEEE  (Volume:6 ,  Issue: 4 )

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System on Chip: the Future of System Integration

System on chip:
The future of the integration paradigm

Syste`me sur une puce:
le futur du paradigme de l’inte ́gration

Wael Badawy

The increase in the number of transistors that can be integrated on a single chip allows the integration of more functions. On the other hand, time-to-market pressures require novel techniques for developing integrated circuits. System on chip is a methodology that allows the integration of several third-party cores with an embedded processor. This paper presents a tutorial for the system- on-chip methodology and presents the design tasks that are involved in developing a system on chip.

L’accroissement du nombre de transistors qu’il est possible d’inte ́grer sur une puce permet d’offrir plus de fonctionnalite ́s. D’autre part, les pressions de la mise en marche ́ rapide de celles-ci exige l’e ́laboration de techniques nouvelles de de ́veloppement de circuits inte ́gre ́s. Les syste`mes sur une puce repre ́sentent une me ́thodologie de de ́veloppement qui permet l’inte ́gration de com- posantes provenant de plusieurs de ́veloppeurs et de les combiner a` un processeur embarque ́. Cet article pre ́sente un tutoriel sur la me ́thodologie de conception de circuits sur une puce et pre ́sente les taˆches de design implique ́es dans le de ́veloppement de tels syste`mes.

 

Wael Badawy, “System on Chip: the Future of System Integration,” The Canadian Journal on Electrical and Computer Engineering, Vol. 27, No. 4, October 2002, pp. 149 – 154

+

DeFET: A Novel CMOS Electric-Field Sensor for Lab-on-a-Chip and Biomedical Applications

This paper presents a novel CMOS electric-field sensor, it is called the “differential electric-field sensitive field-effect transistor” (DeFET), which is based on a standard 0.18-mum Taiwan Semiconductor Manufacturing Company (TSMC) CMOS technology. The DeFET shows a sensitivity of 51.7 mV/(V/mum). This paper also describes the DeFET’s theory of operation in addition to the experimental and simulation results that confirm the DeFET’s theory of operation. Some applications of the DeFET in the area of lab on a chip and biomedical are also presented

Published in:

Sensors Journal, IEEE  (Volume:6 ,  Issue: 4 )